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Associate Professor Bongtae Han was recently elevated to Fellow status as a member of the Society for Experimental Mechanics (SEM). Han receives this recognition for his notable contributions to the Society and to the field of Experimental Mechanics, specifically by his efforts in extending the applicability of moire interferometry into the micromechanics domain, development of new optical techniques, and stress analysis of multi-layer structures using photomechanics methods.
Han will receive recognition for the Fellows award at the 2006 SEM Annual Conference on Experimental Mechanics in St. Louis, Missouri on June 6.
Han's service to SEM includes: Associate Technical Editor for the international journal published by SEM, Experimental Mechanics, from ?98 to ?01; Executive Board Member of SEM from '97-'99; Chair of the Electronics Packaging Division of SEM from '94 to '98; and General Chair for two international symposia sponsored by SEM (the 1st International Symposium on Optical Methodologies and Metrologies for Microelectronics and Photonics in Costa Mesa, California in June 2004; and the 1st International Symposium on Experimental/Numerical Mechanics in Electronic Packaging in Tennessee in 1996).
Professor Han's research interests include mechanical design of microelectronics devices; design assessment of microelectronics devices for optimum reliability; and experimental micro and nanomechanics.
November 15, 2005
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